Connecting manufacturing and measurement

Utilizing data from the manufacturing site, we have established "SPC (Statistical Process Control)" to manufacture only quality products.
The measurement data network system "MeasurLink" collects data from various measuring devices,
Displays statistical processing results such as control charts, histograms, and process capability indices in real time.
Achieve SPC.

Preventing defective products from occurring
Manufacture only quality products

Data from all networked measuring devices is collected in real time, and statistical process control is performed to predict the occurrence of defects.

Quality improvement

Utilizing your valuable measurement results to improve quality

Utilizing your valuable measurement results to improve quality
Utilizing your valuable measurement results to improve quality
  • ● Manufacturing department manager
  • ● Quality Control Department
  • ● Factory executives
  • ● Management (executive directors and president)

Easy to use,
Various data collection screens

A wide variety of data collection screens are available, including statistical analysis results, data list tables, and work instruction image displays, allowing operators to easily switch between different displays depending on their purpose.

data sheet

data sheet

Multiple measurement items can be easily viewed and individual measurement values ​​can be displayed in a table format.

data sheet
2D View
2D View

2D View

Each measurement item can be displayed with a callout line against a workpiece photo or drawing data in the background, making it usable as a work instruction sheet. The result of tolerance judgment is also indicated by the frame color.

2D View

2D View

Each measurement item can be displayed with a callout line against a workpiece photo or drawing data in the background, making it usable as a work instruction sheet. The result of tolerance judgment is also indicated by the frame color.

2D View
Screen layout

Screen layout

Dock manager control allows flexible screen layout.

Screen layout

* Switch tabs with one click.

Xbar-R control chart,
Run charts, etc.
Supports a wide range of statistical analysis functions

A wide variety of statistical analysis and display functions allow you to obtain results suited to your characteristics and purposes.

Supports a wide range of statistical analysis functions, including Xbar-R control charts and run charts
Supports a wide range of statistical analysis functions, including Xbar-R control charts and run charts
chart

[chart]

Quantitative values: XBar-R, XBar-s, X-Rs, EWMA control chart, histogram, run chart, pre-control chart, tear chart, box and whisker chart, meter chart, indicator bar, multivariate control chart, etc. Measurement values: p, np, c, u control chart, Pareto chart, pie chart

Statistics

[Statistics]

Maximum value, minimum value, standard deviation, average ±3σ/4σ/6σ, process capability index (Cp, Cpk, Pp, Ppk), defect rate, etc.

With the alarm function,
Alerts the operator to any abnormalities

The operator is alerted when an abnormality such as "out of tolerance" or "out of control" occurs. The alert method can be selected from pop-up window display, email notification, log file recording, etc.



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